Direct structural evidences of Mn11Ge8 and Mn5Ge2 clusters in Ge0.96Mn0.04 thin films

Yong Wang, Jin Zou, Zuoming Zhao, Xinhai Han, Xiaoyu Zhou, Kang L. Wang

Applied Physics Letters · 2008 · 67 citations · 18 references

Concepts

Abstract

Mn-rich clusters in Mn-doped Ge thin films epitaxially grown on Ge (001) have been investigated by various transmission electron microscopy techniques. Both the mysterious Mn11Ge8 and the hexagonal Mn5Ge2 (a=0.72nm and c=1.3nm) clusters were confirmed to coexist in the thicker Ge0.96Mn0.04 film (80nm). Their possible formation mechanism is attributed to the existence of ordered stacking faults. The fact that no Mn-rich clusters found in thinner films (<=40nm) suggests that, for a given Mn concentration and growth/annealing condition, a critical thickness exists for the formation of Mn-rich clusters.

References

18