Publication | Closed Access
Use of Auger Electron Spectroscopy in Determining the Effect of Carbon and Other Surface Contaminants on GaAs–Cs–O Photocathodes
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Citations
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References
1970
Year
Chemical EngineeringGaas–cs–o PhotosurfacesEngineeringPhysicsPhotochemistryCarbon ContaminationSpectroscopyOther Surface ContaminantsApplied PhysicsGaas–cs–o PhotocathodesNatural SciencesElectron SpectroscopySurface AnalysisPhotoelectric MeasurementAuger Electron SpectroscopyOptoelectronicsCompound Semiconductor
Auger electron spectroscopy has been used to measure quantitatively the amount of carbon contamination on GaAs–Cs–O photosurfaces. It appears that approximately one monolayer of carbon is sufficient to reduce the photoyield to zero.
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