High resolution electron microscopy of defects in materials

Ryan Sinclair, David J. Smith, U. Dahmen

OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 1990 · 70 citations · 0 references

Concepts

Abstract

This book contains the following headings: Metals, Semiconductors, Scanning techniques and theory, Ceramics and mineral, Superconducting oxides.