BACKSCATTERED ELECTRON IMAGES OF POLISHED CEMENT SECTIONS IN THE SCANNING ELECTRON MICROSCOPE

Abstract

Using a pair of backscattered electron detectors in the scanning electron microscope, images can be produced in which the intensity is dependent solely on the molecular weight of the imaged area, and independent of small fluctuations in topography. The use of this technique with polished, unetched cement sections, reveals the unhydrated material, massive calcium hydroxide and other hydration products as clearly distinguishable features of the microstructure.