Applied Physics Letters · 2004 · 81 citations · 10 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsCrystal StructureSolid State PhysicsCrystal LatticeCrystalline MaterialsCrystallographyFerroelectric MaterialsX-ray CrystallographyX-ray DiffractionFerroelectric CrystalsFerroelectric RelaxationFerroelectric Single CrystalsFerroelectric StructurePerovskite Oxide SemiconductorsRelaxor Ferroelectric CeramicsRelaxor FerroelectricsX-ray Diffraction Analysis
We performed x-ray diffraction studies on a series of (1−x)Pb(Zn1/3Nb2/3)O3−xPbTiO3 single crystals with different incident photon energies, and therefore different penetration depths. Our results show that outer layers of ∼10–50 μm thick are present in all samples. The structure of those outer layers is different from that of the inside of the crystals, by having much greater (rhombohedral) distortions. With increasing x, rhombohedral-type lattice distortions develop, both in the outer layer and on the inside.
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