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Rectifying current-voltage characteristics of BiFeO3∕Nb-doped SrTiO3 heterojunction
183
Citations
15
References
2008
Year
Materials ScienceElectrical EngineeringEpitaxial GrowthEngineeringNanoelectronicsOxide ElectronicsApplied PhysicsBifeo3∕nb-doped Srtio3 HeterojunctionEpitaxial C-axisMolecular Beam EpitaxyMicroelectronicsOptoelectronicsBfo Thin FilmSemiconductor Device
Epitaxial c-axis oriented BiFeO3 (BFO) thin films were deposited on (001) Nb-doped SrTiO3 (Nb-STO) substrates by pulsed laser deposition. Introducing Bi vacancies caused the BFO thin film to evolve to a p-type semiconductor and formed a p-n heterojunction with an n-type semiconductor Nb-STO. The current density versus voltage (J-V) and capacitance versus voltage (C-V) characteristics of the heterojunction were investigated. A typical rectifying J-V effect was observed with a large rectifying ratio of 5×104. Reverse C-V characteristics exhibited a linear 1∕C2 versus V plot, from which a built-in potential of 0.6V was deduced. The results show a potential application of BFO/Nb-STO heterojunction for oxide electronics.
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