2003 · 27 citations · 8 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsSemiconductor DevicesDetector TechnologyPhotodetectorsRadiation DetectorsSemiconductor DetectorsAvalanche Photodiode DetectorsAvalanche PhotodiodesPhotodiode CircuitsPhotodiodesPhoton CountingPhoton Counting TechniquesSilicon Photodiodes
Dark count nonlinearity in CMOS compatible, single photon counting, Geiger-mode avalanche photodiodes (GM-APD) has been investigated. A novel structure was designed, fabricated, and characterized to allow dark count optimization. Dark count levels for the proposed structure are shown to scale linearly with area.
8
Linearly Polarized Emission from Colloidal Semiconductor Quantum Rods
Jiangtao Hu, Liang‐shi Li, Weidong Yang et al. · Science · 2001 · 1.2K citations