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Comparison of Spectroscopic Properties of Tm and Ho in YAG and YLF Crystals
15
Citations
1
References
1991
Year
Optical MaterialsEngineeringLaser ScienceLaser ApplicationsLaser MaterialHigh-power LasersYlf CrystalsOptical PropertiesLoss ProcessesMaterials SciencePhotonicsExcitation PowerPhysicsCrystallographySpectroscopic PropertiesNatural SciencesSpectroscopyApplied PhysicsOptoelectronics
The paper compares the cross-relaxation, energy transfer and loss processes in Tm- and Ho-doped YAG and YLF as a function of temperature, Tm concentration, and excitation power. Significant differences in the behavior of Tm and Tm,Ho in YAG and YLF crystals were found. The cross-relaxation rates of Tm(6 pct) are faster in YLF (about 5 microsec) than YAG (about 10 microsec). The energy transfer rates between Tm and Ho are faster in YLF than YAG. The time it takes for the maximum intensity of 1.7-micron emission to drop 10 percent is 25 microsec for YLF:Tm(6 pct),Ho(0.6 pct) and 65 microsec YAG:Tm(6 pct),Ho(0.5 pct). The losses occurring with increasing pump power for 2.1-micron emission of the above samples are 30 percent less in YLF than YAG. These qualitative differences point to YLF as a valuable 2-micron laser host material.
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