Publication | Closed Access
The impact of electrical overstress on the design, handling and application of integrated circuits
19
Citations
7
References
2011
Year
EngineeringElectronic DesignIntegrated CircuitsPower ElectronicsPhysical Design (Electronics)Reliability EngineeringIntegrated Circuit DesignSystems EngineeringElectronic PackagingEos FailsElectrical OverstressElectrical EngineeringHardware ReliabilityComputer EngineeringDevice ReliabilityMicroelectronicsCommon MisconceptionsIndustrial DesignPower IcDesign ProcessCircuit Reliability
Common misconceptions regarding the characteristics of ICs and electrical overstress (EOS) are summarized, analyzed and clarified. In order to avoid EOS fails right from the beginning of the design process, a methodology is developed to deal with EOS in the design, handling and application of ICs.
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