IEEE Electron Device Letters · 2015 · 34 citations · 17 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsMicroelectronicsSemiconductor DevicesBipolar Junction TransistorsComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationField-effect TransistorsIntegrated Circuit DesignSemiconductor ReliabilityBreakdown VoltageBreakdown Voltage OptimizationCathode EffectsInsulated-gate Field-effect TransistorsPunch-throughSwitching Performance
In this letter, a trench-insulated gate bipolar transistor (IGBT) design with local charge compensating layers featured at the cathode of the device is presented and analyzed. The superjunction or reduced surface effect proves to be very effective in overcoming the inherited ON-state versus breakdown tradeoff appearing in conventional devices, such as the soft punch through plus or field stop plus (FS+) IGBTs. This design enhances the ON-state performance of the FS+IGBT by increasing the plasma concentration at the cathode side without affecting either the switching performance or the breakdown rating.
17