The electro-thermal Smoothie database model for LDMOS devices

Abstract

In this paper, we present the electro-thermal (ET) extension of the Smoothie database model for LDMOS devices together with its experimental verification. For the DC verification, the drain current was measured both in continuous mode and under isothermal conditions at different temperatures. In the RF large-signal verification, we used realistic loading conditions for the LDMOS devices while providing two-tone as well as IS-95 CDMA test conditions. With the aid of the above, thermal memory effects were studied by monitoring the device linearity versus tone spacing. In all the experiments, Smoothie demonstrated an excellent agreement with the measured results.