Journal of Applied Physics · 1973 · 69 citations · 15 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsDopingOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor LasersSemiconductor PhysicsCurrent DensityDouble Heterostructure DevicesDouble HeterostructuresElectron DensityGainHeterostructure LasersOptical Gain In SemiconductorsThreshold Behavior
Results are presented to show that at threshold the normalized current density increases and the spontaneous electron lifetime decreases, with increasing acceptor concentration in the active region of double heterostructure stripe geometry lasers. It is shown that, regardless of the acceptor concentration in the range from 2×1017 to 3×1019 cm−3, an injected electron density of about 2×1018 cm−3 is needed in order to achieve lasing in a 12-μm-wide stripe laser. Our threshold data confirm earlier experimental results of higher optical loss and a theoretical prediction of lower gain at a given current for heavily doped material. Variations in threshold current density and spontaneous lifetime as a function of acceptor concentration indicate that the laser transition proceeds by a band-to-band recombination mechanism rather than by a band-to-acceptor mechanism.
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T.M. Quist, R. H. Rediker, R. J. Keyes et al. · Applied Physics Letters · 1962 · 497 citations
Engineering, Electrical Engineering, Condensed Matter Physics +4
Optical Transitions Involving Impurities in Semiconductors
W. P. Dumke · Physical Review · 1963 · 259 citations