Publication | Closed Access
<i>Standard X-Ray Diffraction Powder Patterns</i>
651
Citations
0
References
1954
Year
Materials ScienceX-ray CrystallographyX-ray SpectroscopyEngineeringPhysicsNatural SciencesHigh PurityApplied PhysicsDiffractionX-ray DiffractionMiller IndicesSpace Group ConsiderationsSynchrotron RadiationCrystallographyX-ray OpticMicrostructureX-ray Fluorescence
Patterns were obtained with a Geiger‑counter X‑ray diffractometer on high‑purity samples, with d‑values indexed via calculated interplanar spacings and space‑group analysis, and densities, lattice constants, and refractive indices were calculated or measured. The paper presents 46 standard X‑ray diffraction powder patterns, including 14 replacements for existing entries and 34 new patterns for previously unrepresented substances. Authorship information provided.
Forty-six standard x ray diffraction powder patterns are presented. Fourteen are to repiace twelve patterns already given in the x ray Powder Data File, and thirty-four are for substances not previously included. The patterns were made with a Geiger counter x ray diffractometer, using samples of high purity. The d-values were assigned Miller indices determined by comparison with calculated interplanar spacings and from space group considerations. The densities and lattice constants were calcuiated, and the refractive indices were measured whenever possible. (auth)