Performance evaluation of wavelet-based PCB defect detection and localization algorithm

Abstract

One of the backbones in electronic manufacturing industry is the printed circuit board (PCB) manufacturing. Due to the fatigue and speed requirement, manual inspection is ineffective to inspect every printed circuit board. Hence, this paper presents an efficient algorithm for an automated visual PCB inspection system that is able to automatically detect and locate any defect on PCBs. The defect is detected by utilizing wavelet-based image difference algorithm. The coarse resolution defect localization algorithm, is also presented. The coarse resolution defect localization algorithm is applied to the coarse resolution differenced image in order to locate the defective area on the fine resolution tested PCB image. In addition, the performance of the algorithm is evaluated to verify the efficiency of the proposed algorithm in term of computation time. This new method turned out to be computationally less intensive than traditional image difference operation. One conclusion from this paper is that the second level Haar wavelet transform should be chosen for the application of automated visual PCB inspection.