Rough Surfaces Profiles and Speckle Patterns Analysis by Hurst Exponent Method

Abstract

In this work, a conventional surface roughness comparator is used to perform an analysis of different textures. The Hurst exponent method for the characterization of optical profiles and speckle digital patterns obtained from the comparator was used. By implementation of a simple experimental setup with minimum alignment, information about specific points on the comparator for different roughness was obtained. The processing and analysis of optical signals and images obtained by reflection allowed calculation of Hurst coefficients, revealing a relation between surface roughness, optical profiles and speckle patterns. The setup simplicity and Hurst analysis suggest their combined application on surface metrology.