OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 1985 · 23 citations · 0 references
EngineeringElectrical EngineeringNuclear EngineeringMicroelectronicsRadiation PhysicsSemiconductor DevicesDevice ModelingHigh-dose Radiation EffectsIntegrated Circuit DesignRadiation Damage In MaterialsRadiation ResistanceRadioactive DecayRadiation Damage EffectsRadiation EffectsRadiation ToleranceRadiation-hard DevicesRadiation-tolerant ElectronicsRadiation-tolerant Semiconductor DevicesThermal Effects In Integrated CircuitsTolerance Requirements Analysis
An overview is presented of the effects of radiation in microelectronics technology. The approach taken throughout these notes is to review microscopic phenomena associated with radiation effects and to show how these lead to macroscopic effects in semiconductor devices and integrated circuits. Bipolar integrated circuits technology is reviewed in Appendix A. Appendix B gives present and future applications of radiation-tolerant microelectronics in nuclear power applications as well as the radiation tolerance requirements of these applications.