High resolution microscopy of materials

Abstract

The proceedings volume contains the papers which were presented at the symposium on High Resolution Microscopy of Materials. The symposium provided an interdisciplinary forum for scientists engaged in the use of microscope characterization techniques to study materials. This year the particular focus was towards atomic level imaging and included various types of instruments such as transmission electron microscopes, scanning tunneling microscopes, and field ion microscopes. The proceedings is divided into six sections which follow the order of presentation at the meeting. They are as follows: atomic imaging of defects; surfaces and interfaces; quasicrystals, interfaces and superconductors; ceramics, interfaces and surfaces; instrumentation; and general papers presented as posters. One of the features of the symposium was to emphasize advances in materials applications areas and to effectively cover aspects of instrumentation appropriate to the materials science community.