Micromorphology characterization of copper thin films by AFM and fractal analysis

Atomic Force Microscope

G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text

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X-ray analysis of ZnO nanoparticles by Williamson–Hall and size–strain plot methods

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Calculation of the power spectral density from surface profile data

J. Merle Elson, Jean M. Bennett · Applied Optics · 1995 · 279 citations

Engineering, Materials Engineering, 3D Modeling +16