Publication | Closed Access
Micromorphology characterization of copper thin films by AFM and fractal analysis
92
Citations
42
References
2015
Year
Materials ScienceSurface CharacterizationEngineeringMicrofabricationSurface ScienceApplied PhysicsMicromorphology CharacterizationThin Film Process TechnologyThin FilmsFractal AnalysisCopper Thin FilmsMicrostructureThin Film ProcessingMetallography
| Year | Citations | |
|---|---|---|
Page 1
Page 1