Two-terminal Reliability

Two-Terminal Reliability is the probability that a specified pair of nodes in a network remains connected by at least one operational path, considering the stochastic failure behavior of network components.

70

Publications

3.2K

Citations

124

Authors

70

Institutions

Publications per year

2017–2026

11

Authors

124

  1. JE
    José Emmanuel Ramírez-Márquez

    Stevens Institute of Technology, United States

    8 publications · 671 citations

    8

    h-index

  2. CJ
    Charles J. Colbourn

    Arizona State University, United States

    6 publications · 273 citations

    6

    h-index

  3. KS
    Kishor S. Trivedi

    Duke University, United States

    4 publications · 190 citations

    4

    h-index

  4. CJ
    Chin‐Chia Jane

    Ling Tung University, Taiwan

    4 publications · 218 citations

    4

    h-index

  5. YL
    Yih‐Wenn Laih

    Ling Tung University, Taiwan

    4 publications · 218 citations

    4

    h-index

1–5 of 124

Venues

  1. IEEE Transactions on Reliability

    17 publications · 867 citations

    14

    h-index

  2. Networks

    6 publications · 188 citations

    6

    h-index

  3. Reliability Engineering & System Safety

    5 publications · 481 citations

    5

    h-index

  4. IIE Transactions

    4 publications · 212 citations

    4

    h-index

  5. European Journal of Operational Research

    3 publications · 110 citations

    3

    h-index

1–5