Time Of Flight Diffraction

Time of Flight Diffraction is a non-destructive evaluation technique that belongs to the class of ultrasonic testing methods, distinguished by its use of the diffraction of ultrasonic waves from crack tips or geometric features to accurately determine flaw size and position based on the measured time of flight of the diffracted signals.

141

Publications

5.6K

Citations

512

Authors

170

Institutions

Publications per year

2017–2026

26

Variants

Tofd

Authors

512

  1. KB
    Krishnan Balasubramaniam

    Indian Institute of Technology Madras, India

    9 publications · 252 citations

    9

    h-index

  2. CV
    C. V. Krishnamurthy

    Indian Institute of Technology Madras, India

    6 publications · 148 citations

    6

    h-index

  3. AK
    Alan K. Soper

    Rutherford Appleton Laboratory, United Kingdom

    6 publications · 327 citations

    6

    h-index

  4. SN
    S.K. Nath

    Central Power Research Institute, India

    5 publications · 100 citations

    5

    h-index

  5. XS
    Xu Sun

    Dalian University of Technology, China

    5 publications · 81 citations

    5

    h-index

1–5 of 512

Venues

  1. 9

    h-index

  2. Journal of Applied Crystallography

    8 publications · 393 citations

    8

    h-index

  3. NDT & E International

    6 publications · 209 citations

    6

    h-index

  4. Ultrasonics

    6 publications · 219 citations

    6

    h-index

  5. Journal of Physics Condensed Matter

    5 publications · 108 citations

    5

    h-index

1–5