Thin Film Interference

Thin Film Interference is an optical phenomenon in which light waves reflected from the upper and lower boundaries of a thin film interfere constructively or destructively due to differences in optical path length, resulting in wavelength-dependent variations in reflectance and transmittance.

252

Publications

13.9K

Citations

886

Authors

294

Institutions

Publications per year

2017–2026

46

Variants

Thin-film Interference

Authors

886

  1. MJ
    Michael J. Sailor

    University of California San Diego, United States

    3 publications · 245 citations

    3

    h-index

  2. SY
    Shinya Yoshioka

    Kyoto University, Japan

    3 publications · 1.1K citations

    3

    h-index

  3. MD
    Matthew D. Shawkey

    University of Akron, United States

    3 publications · 372 citations

    3

    h-index

  4. XY
    Xiaohong Yuan

    Minjiang University, China

    2 publications · 33 citations

    2

    h-index

  5. SC
    Shan Cong

    Suzhou Institute of Nano-tech and Nano-bionics, China

    2 publications · 65 citations

    2

    h-index

1–5 of 886

Venues

  1. Applied Optics

    20 publications · 752 citations

    15

    h-index

  2. Journal of Applied Physics

    12 publications · 541 citations

    12

    h-index

  3. Optics Express

    11 publications · 324 citations

    11

    h-index

  4. Applied Physics Letters

    8 publications · 321 citations

    8

    h-index

  5. Journal of the Optical Society of America

    JOSA · 7 publications · 143 citations

    7

    h-index

1–5