Terahertz Ellipsometry
Terahertz Ellipsometry is a non-destructive optical technique that belongs to the class of ellipsometric methods and is distinguished by its use of terahertz radiation to measure the change in polarization state of electromagnetic waves upon reflection or transmission, thereby enabling the determination of complex dielectric properties and layered structures of materials in the terahertz frequency range.
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2017–2026
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Verdad C. Agulto, Toshiyuki Iwamoto, Hideaki Kitahara et al. · Scientific Reports · 2021 · 75 citations · Full text
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The University of Osaka
Osaka, Japan
6 h-index
26 publications
1.7K citations
J.A. Woollam Company (United States)
Lincoln, United States
5 h-index
9 publications
633 citations
University of Nebraska–Lincoln
Lincoln, United States
5 h-index
11 publications
754 citations

National Technical University "Kharkiv Polytechnic Institute"
Kharkiv, Ukraine
2 h-index
3 publications
66 citations
O.Ya. Usikov Institute for Radiophysics and Electronics
Kharkiv, Ukraine
2 h-index
4 publications
88 citations
Chinese University of Hong Kong
Hong Kong, Hong Kong
2 h-index
6 publications
180 citations

University of Warwick
Coventry, United Kingdom
2 h-index
4 publications
140 citations
Zhejiang University of Science and Technology
Hangzhou, China
1 h-index
1 publications
33 citations
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4 publications · 224 citations
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3 publications · 216 citations
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2 publications · 84 citations
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2 publications · 85 citations
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