Terahertz Ellipsometry

Terahertz Ellipsometry is a non-destructive optical technique that belongs to the class of ellipsometric methods and is distinguished by its use of terahertz radiation to measure the change in polarization state of electromagnetic waves upon reflection or transmission, thereby enabling the determination of complex dielectric properties and layered structures of materials in the terahertz frequency range.

26

Publications

1.7K

Citations

106

Authors

44

Institutions

Publications per year

2017–2026

10

Authors

106

  1. MH
    Masanori Hangyo

    The University of Osaka, Japan

    4 publications · 415 citations

    4

    h-index

  2. MS
    M. Schubert

    University of Nebraska–Lincoln, United States

    4 publications · 280 citations

    4

    h-index

  3. CM
    Craig M. Herzinger

    J.A. Woollam Company (United States), United States

    4 publications · 280 citations

    4

    h-index

  4. TN
    Takeshi Nagashima

    The University of Osaka, Japan

    3 publications · 351 citations

    3

    h-index

  5. TH
    Tino Hofmann

    University of Nebraska–Lincoln, United States

    3 publications · 217 citations

    3

    h-index

1–5 of 106

Venues

  1. Applied Physics Letters

    4 publications · 224 citations

    4

    h-index

  2. Review of Scientific Instruments

    3 publications · 216 citations

    3

    h-index

  3. 2

    h-index

  4. Optics Express

    2 publications · 84 citations

    2

    h-index

  5. 2

    h-index

1–5