The "System Response Function" is a mathematical model that characterizes the output behavior of an X-ray detection system in response to a given input signal, distinguishing itself by quantifying the system's fidelity, resolution, and sensitivity in transforming incident X-ray photons into measurable electronic or image data.
256
Publications
13.2K
Citations
768
Authors
343
Institutions
Publications per year
2017–2026
45
Parents
Publications
256
Tomoo Mitsunaga, Shree K. Nayar · 2003 · 711 citations
Frequency Analysis of Variable Networks
Lotfi A. Zadeh · Proceedings of the IRE · 1950 · 584 citations
Engineering, Electrical Engineering, Systems Engineering +17
1–5 of 256
Authors
768
- GG
4
h-index
- JR
4
h-index
- BG
4
h-index
- AA
3
h-index
- IH
3
h-index
1–5 of 768
Institutions
343
University of Colorado Boulder
Boulder, United States
5 h-index
9 publications
604 citations
University of California, Davis
Davis, United States
4 h-index
6 publications
140 citations
Massachusetts Institute of Technology
Cambridge, United States
4 h-index
18 publications
534 citations
University of Utah
Salt Lake City, United States
4 h-index
8 publications
420 citations
University of Canterbury
Christchurch, New Zealand
4 h-index
11 publications
844 citations
Columbia University
New York, United States
4 h-index
5 publications
1.9K citations
Philips (Germany)
Hamburg, Germany
4 h-index
14 publications
2.5K citations
Hong Kong University of Science and Technology
Hong Kong, Hong Kong
4 h-index
10 publications
544 citations
1–8 of 343
Venues
- Physics in Medicine and Biology
10 publications · 709 citations
10
h-index
- Applied Optics
4 publications · 115 citations
4
h-index
- International Journal of Control
4 publications · 517 citations
4
h-index
- The Journal of the Acoustical Society of America
JASA · 4 publications · 151 citations
4
h-index
- IEEE Transactions on Instrumentation and Measurement
4 publications · 86 citations
4
h-index
1–5