Swipe Sample Analysis

Swipe Sample Analysis is a nuclear forensic method involving the collection and laboratory examination of particulate materials from surfaces using swipes to identify and characterize nuclear or radioactive substances for origin attribution and safeguard verification.

23

Publications

752

Citations

108

Authors

34

Institutions

Publications per year

2017–2026

7

Authors

108

  1. DA
    Debra A. Bostick

    Oak Ridge National Laboratory, United States

    3 publications · 115 citations

    3

    h-index

  2. BW
    Brian W. Ticknor

    Oak Ridge National Laboratory, United States

    3 publications · 115 citations

    3

    h-index

  3. SU
    Shigekazu Usuda

    Japan Atomic Energy Agency, Japan

    3 publications · 131 citations

    3

    h-index

  4. FE
    Fumitaka Esaka

    Japan Atomic Energy Agency, Japan

    3 publications · 131 citations

    3

    h-index

  5. BT
    Benjamin T. Manard

    Oak Ridge National Laboratory, United States

    3 publications · 90 citations

    3

    h-index

1–5 of 108

Venues

  1. Analytical Methods

    2 publications · 102 citations

    2

    h-index

  2. Analytical Chemistry

    2 publications · 68 citations

    2

    h-index

  3. Talanta

    2 publications · 66 citations

    2

    h-index

  4. Journal of Nuclear Science and Technology

    JNST · 2 publications · 81 citations

    2

    h-index

  5. PubMed

    Repository · 1 publications · 23 citations

    1

    h-index

1–5