Swipe Sample Analysis
Swipe Sample Analysis is a nuclear forensic method involving the collection and laboratory examination of particulate materials from surfaces using swipes to identify and characterize nuclear or radioactive substances for origin attribution and safeguard verification.
23
Publications
752
Citations
108
Authors
34
Institutions
Publications per year
2017–2026
7
Parents
23
Fumitaka Esaka, Kazuo Watanabe, Hiroyasu Fukuyama et al. · Journal of Nuclear Science and Technology · 2004 · 66 citations
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Oak Ridge National Laboratory
Oak Ridge, United States
3 h-index
17 publications
685 citations
Japan Atomic Energy Agency
Tōkai Mura, Japan
3 h-index
22 publications
1K citations
Forschungszentrum Jülich
Jülich, Germany
2 h-index
10 publications
156 citations
National Institute of Standards and Technology
Gaithersburg, United States
2 h-index
10 publications
730 citations

University of Maine
Orono, United States
1 h-index
1 publications
17 citations

University of Alberta Hospital
Edmonton, Canada
1 h-index
2 publications
64 citations
Engineering Systems (United States)
Omaha, United States
1 h-index
1 publications
17 citations
CEA DAM Île-de-France
Bruyères-le-Châtel, France
1 h-index
2 publications
36 citations
1–8 of 34
2 publications · 102 citations
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2 publications · 68 citations
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2 publications · 66 citations
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JNST · 2 publications · 81 citations
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Repository · 1 publications · 23 citations
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1–5