Spectroscopic Label Analysis

Spectroscopic Label Analysis is a forensic method that identifies and authenticates labeling materials by analyzing their unique spectral signatures to detect anomalies indicative of tampering or counterfeiting.

3

Publications

51

Citations

8

Authors

6

Institutions

Publications per year

2017–2026

2

Authors

8

  1. NL
    Nadia L. Zakamska

    Johns Hopkins University, United States

    1 publications · 24 citations

    1

    h-index

  2. FM
    F. Mikeš

    Universidad Carlos III de Madrid, Spain

    1 publications · 10 citations

    1

    h-index

  3. VC
    Vedant Chandra

    Center for Astrophysics Harvard & Smithsonian, United States

    1 publications · 24 citations

    1

    h-index

  4. TB
    Tamás Budavári

    Johns Hopkins University, United States

    1 publications · 24 citations

    1

    h-index

  5. HH
    Hsiang-Chih Hwang

    Johns Hopkins University, United States

    1 publications · 24 citations

    1

    h-index

1–5 of 8

Venues

  1. Journal of Chromatography A

    1 publications · 10 citations

    1

    h-index

  2. 1

    h-index

  3. The Explicator

    1 publications · 17 citations

    1

    h-index

  4. Journal of Molecular Structure

    1 publications · 11 citations

1–4