Snubber Transient Analysis
Snubber Transient Analysis is a methodological framework within power electronics that characterizes the dynamic voltage and current transient responses in snubber circuits to optimize their design for suppressing ringing and minimizing energy dissipation during switching events.
17
Publications
518
Citations
54
Authors
27
Institutions
Publications per year
2017–2026
4
Parents
17
1–5 of 17
54
2
h-index
National Institute of Standards and Technology, United States
2 publications · 159 citations
2
h-index
2
h-index
1
h-index
1
h-index
1–5 of 54
27
Eaton (United States)
Cleveland, United States
3 h-index
7 publications
202 citations
National Institute of Standards and Technology
Gaithersburg, United States
2 h-index
2 publications
159 citations
Eaton (Taiwan)
Taipei, Taiwan
2 h-index
5 publications
164 citations

Drexel University
Philadelphia, United States
1 h-index
2 publications
54 citations

State Grid Corporation of China (China)
Beijing, China
1 h-index
1 publications
27 citations

North China Electric Power University
Beijing, China
1 h-index
4 publications
108 citations

University of Aberdeen
Aberdeen, United Kingdom
1 h-index
3 publications
225 citations
Tsinghua University
Beijing, China
1 h-index
6 publications
198 citations
1–8 of 27
3 publications · 81 citations
3
h-index
3 publications · 186 citations
3
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1 publications · 36 citations
1
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1 publications · 75 citations
1
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1 publications · 19 citations
1
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1–5