Snubber Transient Analysis

Snubber Transient Analysis is a methodological framework within power electronics that characterizes the dynamic voltage and current transient responses in snubber circuits to optimize their design for suppressing ringing and minimizing energy dissipation during switching events.

17

Publications

518

Citations

54

Authors

27

Institutions

Publications per year

2017–2026

4

Authors

54

  1. DD
    David D. Shipp

    Eaton (United States), United States

    2 publications · 53 citations

    2

    h-index

  2. AR
    Allen R. Hefner

    National Institute of Standards and Technology, United States

    2 publications · 159 citations

    2

    h-index

  3. TJ
    Thomas J. Dionise

    Eaton (United States), United States

    2 publications · 56 citations

    2

    h-index

  4. KL
    Kexin Liu

    State Grid Corporation of China (China), China

    1 publications · 27 citations

    1

    h-index

  5. BF
    Babak Farhangi

    University of Tehran, Iran

    1 publications · 20 citations

    1

    h-index

1–5 of 54

Venues

  1. IEEE Transactions on Power Electronics

    3 publications · 81 citations

    3

    h-index

  2. IEEE Transactions on Industry Applications

    3 publications · 186 citations

    3

    h-index

  3. IEEE Transactions on Plasma Science

    1 publications · 36 citations

    1

    h-index

  4. International Journal of Mechanical Sciences

    1 publications · 75 citations

    1

    h-index

  5. IEEE Industry Applications Magazine

    1 publications · 19 citations

    1

    h-index

1–5