Shield Thickness Dependence
Shield Thickness Dependence is a radiological measurement model that characterizes the variation in radiation buildup factors as a function of the depth and material properties of a shielding medium, distinguishing it from incident-energy or source-configurational dependencies.
38
Publications
979
Citations
128
Authors
59
Institutions
Publications per year
2017–2026
7
Parents
38
1–5 of 38
128
3
h-index
2
h-index
2
h-index
2
h-index
2
h-index
1–5 of 128
59

Langley Research Center
Hampton, United States
4 h-index
6 publications
88 citations
Ca' Foscari University of Venice
Venice, Italy
2 h-index
5 publications
77 citations
National Geophysical Research Institute
Hyderabad, India
2 h-index
5 publications
97 citations

Harbin Institute of Technology
Harbin, China
2 h-index
10 publications
508 citations
Argonne National Laboratory
Lemont, United States
2 h-index
4 publications
57 citations
Shandong Institute of Business and Technology
Yantai, China
1 h-index
1 publications
16 citations
National Tsing Hua University
Hsinchu, Taiwan
1 h-index
2 publications
82 citations
Emory University
Atlanta, United States
1 h-index
1 publications
23 citations
1–8 of 59
2 publications · 24 citations
2
h-index
2 publications · 37 citations
2
h-index
2 publications · 81 citations
2
h-index
2 publications · 52 citations
2
h-index
2 publications · 33 citations
2
h-index
1–5