Shield Thickness Dependence

Shield Thickness Dependence is a radiological measurement model that characterizes the variation in radiation buildup factors as a function of the depth and material properties of a shielding medium, distinguishing it from incident-energy or source-configurational dependencies.

38

Publications

979

Citations

128

Authors

59

Institutions

Publications per year

2017–2026

7

Authors

128

  1. JW
    John Wilson

    Langley Research Center, United States

    3 publications · 48 citations

    3

    h-index

  2. FA
    Francis A. Cucinotta

    Johnson Space Center, United States

    2 publications · 27 citations

    2

    h-index

  3. IC
    Ilenia Ciani

    University of Edinburgh, United Kingdom

    2 publications · 31 citations

    2

    h-index

  4. SD
    Salvatore Daniele

    Ca' Foscari University of Venice, Italy

    2 publications · 31 citations

    2

    h-index

  5. LW
    Lawrence W. Townsend

    Langley Research Center, United States

    2 publications · 31 citations

    2

    h-index

1–5 of 128

Venues

  1. IEEE Transactions on Magnetics

    2 publications · 24 citations

    2

    h-index

  2. 2

    h-index

  3. Earth and Planetary Science Letters

    2 publications · 81 citations

    2

    h-index

  4. IEEE Transactions on Nuclear Science

    2 publications · 52 citations

    2

    h-index

  5. Nuclear Technology

    2 publications · 33 citations

    2

    h-index

1–5