Semi-supervised Metric Learning

Semi-Supervised Metric Learning is a subcategory of metric learning methods that leverages both labeled and unlabeled data to learn a distance function, distinguishing itself from purely supervised or unsupervised approaches by incorporating limited supervision in the form of sparse label information to guide the similarity structure.

123

Publications

10.3K

Citations

348

Authors

175

Institutions

Publications per year

2017–2026

47

Authors

348

  1. IS
    Inderjit S. Dhillon

    The University of Texas at Austin, United States

    5 publications · 330 citations

    5

    h-index

  2. DY
    Dit‐Yan Yeung

    Hong Kong University of Science and Technology, Hong Kong SAR China

    5 publications · 266 citations

    5

    h-index

  3. SC
    Steven C. H. Hoi

    Nanyang Technological University, Singapore

    4 publications · 451 citations

    4

    h-index

  4. HC
    Hong Chang

    Institute of Computing Technology, China

    4 publications · 237 citations

    4

    h-index

  5. BK
    Brian Kulis

    The University of Texas at Austin, United States

    4 publications · 873 citations

    4

    h-index

1–5 of 348

Venues

  1. arXiv (Cornell University)

    Repository · 9 publications · 698 citations

    9

    h-index

  2. Neurocomputing

    6 publications · 325 citations

    6

    h-index

  3. Pattern Recognition

    6 publications · 347 citations

    6

    h-index

  4. Knowledge-Based Systems

    4 publications · 170 citations

    4

    h-index

  5. IEEE Transactions on Knowledge and Data Engineering

    TKDE · 4 publications · 174 citations

    4

    h-index

1–5