Self-supervised Metric Learning

Self-Supervised Metric Learning is a metric learning paradigm that, belonging to the broader class of self-supervised learning methods, specifically learns discriminative distance functions over data by leveraging intrinsic supervisory signals derived from data augmentations or structural priors without requiring explicit human-annotated labels.

36

Publications

2K

Citations

180

Authors

57

Institutions

Publications per year

2017–2026

32

Authors

180

  1. HX
    Hongtao Xie

    University of Science and Technology of China, China

    2 publications · 49 citations

    2

    h-index

  2. MH
    Munawar Hayat

    Monash University, Australia

    2 publications · 85 citations

    2

    h-index

  3. CL
    Corey Lynch

    Google (United States), United States

    2 publications · 608 citations

    2

    h-index

  4. CK
    Carl K. Edwards

    Amgen (United States), United States

    2 publications · 148 citations

    2

    h-index

  5. YZ
    Yongdong Zhang

    University of Science and Technology of China, China

    2 publications · 45 citations

    2

    h-index

1–5 of 180

Venues

  1. arXiv (Cornell University)

    Repository · 8 publications · 248 citations

    8

    h-index

  2. 3

    h-index

  3. Proceedings of the AAAI Conference on Artificial Intelligence

    Conference · 2 publications · 54 citations

    2

    h-index

  4. 2022 26th International Conference on Pattern Recognition (ICPR)

    Conference · 1 publications · 44 citations

    1

    h-index

  5. Neural Networks

    1 publications · 82 citations

    1

    h-index

1–5