Resolution Function Modeling is a computational method that characterizes the probability distribution of measured energy values around a true energy state to quantify the intrinsic precision of a detection system in spectroscopic applications.
96
Publications
6.1K
Citations
251
Authors
100
Institutions
Publications per year
2017–2026
4
Parents
Publications
96
1–5 of 96
Authors
251
- SH
7
h-index
- MJ
5
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- JS
4
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- WH
3
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- JC
3
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1–5 of 251
Institutions
100
European Synchrotron Radiation Facility
Grenoble, France
3 h-index
9 publications
183 citations
Institut Laue-Langevin
Grenoble, France
3 h-index
3 publications
54 citations
Argonne National Laboratory
Lemont, United States
3 h-index
6 publications
298 citations
Forschungszentrum Jülich
Jülich, Germany
3 h-index
6 publications
111 citations
Los Alamos National Laboratory
Los Alamos, United States
3 h-index
6 publications
190 citations
Brookhaven National Laboratory
Upton, United States
3 h-index
9 publications
798 citations
Oak Ridge National Laboratory
Oak Ridge, United States
2 h-index
3 publications
1.3K citations
Institute for Atomic and Molecular Physics
Amsterdam, The Netherlands
2 h-index
8 publications
360 citations
1–8 of 100
Venues
- Journal of Applied Crystallography
17 publications · 765 citations
13
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- Acta Crystallographica Section A
10 publications · 499 citations
10
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- Surface and Interface Analysis
SIA · 7 publications · 260 citations
7
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- Acta Crystallographica Section A Foundations of Crystallography
6 publications · 191 citations
6
h-index
- Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
6 publications · 208 citations
6
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1–5