Reliability Growth Modeling

Reliability Growth Modeling is a reliability modeling technique that characterizes the improvement in system reliability over time through the systematic identification, correction, and incorporation of fault fixes during testing and development.

557

Publications

23.7K

Citations

769

Authors

368

Institutions

Publications per year

2017–2026

80

Authors

769

  1. SY
    Shigeru Yamada

    Tottori University, Japan

    37 publications · 3K citations

    23

    h-index

  2. PK
    P. K. Kapur

    University of Delhi, India

    44 publications · 1.5K citations

    21

    h-index

  3. HP
    Hoang Pham

    Rutgers, The State University of New Jersey, United States

    18 publications · 1.2K citations

    16

    h-index

  4. MR
    Michael R. Lyu

    Chinese University of Hong Kong, Hong Kong SAR China

    15 publications · 1.2K citations

    14

    h-index

  5. CH
    Chin‐Yu Huang

    National Tsing Hua University, Taiwan

    14 publications · 1.2K citations

    13

    h-index

1–5 of 769

Venues

  1. IEEE Transactions on Reliability

    78 publications · 5.9K citations

    41

    h-index

  2. Technometrics

    20 publications · 897 citations

    17

    h-index

  3. IEEE Transactions on Software Engineering

    TSE · 16 publications · 2.3K citations

    16

    h-index

  4. 15

    h-index

  5. 13

    h-index

1–5