Concepedia

Reflectance Parameterization

Reflectance Parameterization is a computational framework that characterizes surface reflectance properties by mapping incident and outgoing light directions to a reduced set of intrinsic material parameters within the broader domain of reflectance visualization.

62

Publications

6.9K

Citations

185

Authors

107

Institutions

Publications per year

2017–2026

14

Parents

Publications

62

Reflectance and texture of real-world surfaces

Kristin Dana, Bram van Ginneken, Shree K. Nayar et al. · ACM Transactions on Graphics · 1999 · 1.3K citations · Full text

, , +15

A TM Tasseled Cap equivalent transformation for reflectance factor data

E. P. Crist · Remote Sensing of Environment · 1985 · 823 citations

, , +10

Evaluation of linear models of surface spectral reflectance with small numbers of parameters

Laurence T. Maloney · Journal of the Optical Society of America A · 1986 · 749 citations

, , +16

Derivation of scaled surface reflectances from AVIRIS data

Bo‐Cai Gao, Kathleen B. Heidebrecht, Alexander Goetz · Remote Sensing of Environment · 1993 · 473 citations

, , +12

Exploitation of multiple incidences spectrometric measurements for thin film reverse engineering

Lihong Gao, Fabien Lemarchand, Michel Lequime · Optics Express · 2012 · 322 citations · Full text

, , +17

1–5 of 62

Authors

185

  1. KI
    Katsushi Ikeuchi

    The University of Tokyo, Japan

    4 publications · 437 citations

    4

    h-index

  2. SK
    Shree K. Nayar

    Columbia University, United States

    4 publications · 1.8K citations

    4

    h-index

  3. DW
    Donald W. Deering

    Goddard Space Flight Center, United States

    3 publications · 172 citations

    3

    h-index

  4. KD
    Kristin Dana

    Rutgers, The State University of New Jersey, United States

    2 publications · 1.5K citations

    2

    h-index

  5. TK
    Takeo Kanade

    Carnegie Mellon University, United States

    2 publications · 291 citations

    2

    h-index

1–5 of 185

Institutions

107

  1. Carnegie Mellon University

    Pittsburgh, United States

    4 h-index

    9 publications

    1K citations

  2. Institut national de recherche en sciences et technologies du numérique

    Le Chesnay-Rocquencourt, France

    4 h-index

    7 publications

    111 citations

  3. Goddard Space Flight Center

    Greenbelt, United States

    3 h-index

    4 publications

    210 citations

  4. Centre National de la Recherche Scientifique

    Paris, France

    3 h-index

    5 publications

    995 citations

  5. Utrecht University

    Utrecht, The Netherlands

    2 h-index

    4 publications

    3.1K citations

  6. University of California San Diego

    San Diego, United States

    2 h-index

    3 publications

    270 citations

  7. Agricultural Research Service

    Washington, United States

    2 h-index

    6 publications

    919 citations

  8. Columbia University

    New York, United States

    2 h-index

    4 publications

    3.1K citations

1–8 of 107

Venues

  1. ACM Transactions on Graphics

    TOG · 8 publications · 1.9K citations

    8

    h-index

  2. Journal of the Optical Society of America A

    4 publications · 815 citations

    4

    h-index

  3. Remote Sensing of Environment

    4 publications · 1.5K citations

    4

    h-index

  4. Computer Graphics Forum

    3 publications · 67 citations

    3

    h-index

  5. Applied Optics

    3 publications · 48 citations

    3

    h-index

1–5