Concepedia

Post-silicon Debugging

Post-Silicon Debugging is a hardware validation methodology that distinguishes itself by identifying and diagnosing functional and electrical defects in integrated circuits after they have been fabricated in silicon, as opposed to relying solely on pre-silicon verification techniques.

110

Publications

3.3K

Citations

302

Authors

63

Institutions

Publications per year

2017–2026

9

Parents

Publications

110

Validating the intel pentium 4 microprocessor

Bob Bentley · 2001 · 110 citations

, , +11

Trace signal selection for visibility enhancement in post-silicon validation

Xiao Liu, Qiang Xu · 2009 · 95 citations

, , +13

Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA)

Sung-Boem Park, Ted Hong, Subhasish Mitra · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2009 · 92 citations

, , +13

Automated trace signals identification and state restoration for improving observability in post-silicon validation

Ho Fai Ko, Nicola Nicolici · 2008 · 91 citations

, , +14

BackSpace: Formal Analysis for Post-Silicon Debug

Flavio M. De Paula, Marcel Gort, Alan J. Hu et al. · 2008 · 91 citations · Full text

, , +12

1–5 of 110

Authors

302

  1. VB
    Valeria Bertacco

    University of Michigan, United States

    13 publications · 436 citations

    13

    h-index

  2. PM
    Prabhat Mishra

    University of Florida, United States

    12 publications · 312 citations

    12

    h-index

  3. QX
    Qiang Xu

    Chinese University of Hong Kong, Hong Kong SAR China

    10 publications · 333 citations

    10

    h-index

  4. NN
    Nicola Nicolici

    McMaster University, Canada

    9 publications · 304 citations

    9

    h-index

  5. HF
    Ho Fai Ko

    McMaster University, Canada

    9 publications · 304 citations

    9

    h-index

1–5 of 302

Institutions

63

  1. Intel (United States)

    Santa Clara, United States

    16 h-index

    115 publications

    3.4K citations

  2. University of Florida

    Gainesville, United States

    13 h-index

    32 publications

    779 citations

  3. University of Michigan

    Ann Arbor, United States

    13 h-index

    37 publications

    1.3K citations

  4. Chinese University of Hong Kong

    Hong Kong, Hong Kong

    10 h-index

    20 publications

    666 citations

  5. McMaster University

    Hamilton, Canada

    9 h-index

    19 publications

    652 citations

  6. University of Wisconsin–Madison

    Madison, United States

    6 h-index

    13 publications

    312 citations

  7. Stanford University

    Stanford, United States

    6 h-index

    14 publications

    671 citations

  8. IBM (United States)

    Armonk, United States

    5 h-index

    13 publications

    557 citations

1–8 of 63

Venues

  1. 9

    h-index

  2. 5

    h-index

  3. IEEE Design & Test of Computers

    3 publications · 51 citations

    3

    h-index

  4. 2008 Design, Automation and Test in Europe

    Conference · 2 publications · 66 citations

    2

    h-index

  5. 1

    h-index

1–5