Polarization-based Material Analysis

Polarization-Based Material Analysis is a computational imaging technique that distinguishes material properties by analyzing the polarization state of light interacting with translucent surfaces, enabling the decomposition and characterization of subsurface scattering and surface reflectance components in translucency visualization.

45

Publications

1.1K

Citations

151

Authors

62

Institutions

Publications per year

2017–2026

9

Authors

151

  1. JS
    Jinlong Su

    Huazhong University of Science and Technology, China

    2 publications · 65 citations

    2

    h-index

  2. JS
    J. Scott Tyo

    University of Arizona, United States

    2 publications · 39 citations

    2

    h-index

  3. YC
    Yayun Cheng

    Huazhong University of Science and Technology, China

    2 publications · 65 citations

    2

    h-index

  4. FH
    Fei Hu

    Huazhong University of Science and Technology, China

    2 publications · 65 citations

    2

    h-index

  5. AS
    A.D. Sanchis Dufau

    Medical University of Vienna, Austria

    1 publications · 17 citations

    1

    h-index

1–5 of 151

Venues

  1. Applied Optics

    3 publications · 97 citations

    3

    h-index

  2. Materials Characterization

    2 publications · 54 citations

    2

    h-index

  3. 2

    h-index

  4. Optics Communications

    1 publications · 20 citations

    1

    h-index

  5. Acta Histochemica

    1 publications · 11 citations

    1

    h-index

1–5