Parallelism Measurement

Parallelism Measurement is a geometric dimensioning and tolerance assessment method that specifies the allowable deviation between two derived features or elements relative to a datum, distinguishing itself within form and length metrology by quantifying the degree to which two surfaces or axes maintain equidistant orientation over their entire extent.

50

Publications

2.4K

Citations

102

Authors

69

Institutions

Publications per year

2017–2026

3

Authors

102

  1. DA
    David A. Williams

    University of Michigan, United States

    2 publications · 111 citations

    2

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  2. JM
    Jörg M. Steiner

    Texas A&M University, United States

    2 publications · 111 citations

    2

    h-index

  3. MK
    Milind Kulkarni

    Purdue University West Lafayette, United States

    2 publications · 189 citations

    2

    h-index

  4. KA
    Katie Antypas

    Lawrence Berkeley National Laboratory, United States

    2 publications · 187 citations

    2

    h-index

  5. HS
    Hongzhang Shan

    Lawrence Berkeley National Laboratory, United States

    2 publications · 187 citations

    2

    h-index

1–5 of 102

Venues

  1. IEEE Transactions on Computers

    3 publications · 338 citations

    3

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  2. 2

    h-index

  3. PubMed

    Repository · 2 publications · 73 citations

    2

    h-index

  4. American Journal of Veterinary Research

    AJVR · 1 publications · 54 citations

    1

    h-index

  5. Personnel Psychology

    1 publications · 43 citations

    1

    h-index

1–5