Object Profiling

Object Profiling is the inverse electromagnetic characterization method that uniquely identifies the geometric, material, and spatial attributes of a concealed or inaccessible object by reconstructing its physical properties from scattered field measurements.

7

Publications

313

Citations

20

Authors

10

Institutions

Publications per year

2017–2026

2

Authors

20

  1. DM
    Darko Marinov

    University of Illinois Urbana-Champaign, United States

    1 publications · 60 citations

    1

    h-index

  2. JA
    Jonathan Ashdown

    United States Air Force Research Laboratory, United States

    1 publications · 58 citations

    1

    h-index

  3. KD
    Kshitij Doshi

    Intel (United States), United States

    1 publications · 19 citations

    1

    h-index

  4. PA
    Prasad A. Kulkarni

    University of Kansas, United States

    1 publications · 19 citations

    1

    h-index

  5. VK
    Vana Kalogeraki

    Athens University of Economics and Business, Greece

    1 publications · 18 citations

    1

    h-index

1–5 of 20

Venues

  1. Journal of Communications and Networks

    1 publications · 58 citations

    1

    h-index

  2. Journal of Lightwave Technology

    1 publications · 56 citations

    1

    h-index

  3. Applied Optics

    AO · 1 publications · 11 citations

  4. ACM Transactions on Architecture and Code Optimization

    TACO · 1 publications · 10 citations

1–4