Concepedia

External Component Failures

External Component Failures is a device troubleshooting phenomenon characterized by malfunctions originating in peripheral or auxiliary hardware units physically distinct from the core system, thereby distinguishing it from internal or embedded component defects.

104

Publications

5.7K

Citations

302

Authors

157

Institutions

Publications per year

2017–2026

17

Parents

Publications

104

A generalized likelihood ratio approach to the detection and estimation of jumps in linear systems

Alan S. Willsky, Harold E. Jones · IEEE Transactions on Automatic Control · 1976 · 863 citations

, , +17

Failure detection and identification

Mohammad-Ali Massoumnia, George C. Verghese, Alan S. Willsky · IEEE Transactions on Automatic Control · 1989 · 585 citations

, , +13

Survivable information storage systems

Jay J. Wylie, Michael W. Bigrigg, John D. Strunk et al. · Computer · 2000 · 218 citations

, , +17

Performance Measurement and Design in Supply Chains

Stanley Baiman, Paul E. Fischer, Madhav V. Rajan · Management Science · 2001 · 201 citations

, , +13

BDD-based reliability evaluation of phased-mission systems with internal/external common-cause failures

Liudong Xing, Gregory Levitin · Reliability Engineering & System Safety · 2012 · 145 citations

, , +16

1–5 of 104

Authors

302

  1. AS
    Alan S. Willsky

    Massachusetts Institute of Technology, United States

    4 publications · 1.7K citations

    4

    h-index

  2. RL
    Ross L. Fink

    Bradley University, United States

    2 publications · 24 citations

    2

    h-index

  3. HE
    Harold E. Jones

    University of California, Berkeley, United States

    2 publications · 979 citations

    2

    h-index

  4. LM
    Leslie M. Moore

    Los Alamos National Laboratory, United States

    2 publications · 25 citations

    2

    h-index

  5. FC
    Fabian C. Hadipriono

    The Ohio State University, United States

    2 publications · 36 citations

    2

    h-index

1–5 of 302

Institutions

157

  1. Carnegie Mellon University

    Pittsburgh, United States

    3 h-index

    11 publications

    1.7K citations

  2. Massachusetts Institute of Technology

    Cambridge, United States

    3 h-index

    5 publications

    2.7K citations

  3. The Ohio State University

    Columbus, United States

    2 h-index

    5 publications

    98 citations

  4. Aalborg University

    Aalborg, Denmark

    2 h-index

    2 publications

    132 citations

  5. Georgia Institute of Technology

    Atlanta, United States

    2 h-index

    3 publications

    33 citations

  6. Shanghai Jiao Tong University

    Shanghai, China

    2 h-index

    2 publications

    25 citations

  7. National University of Singapore

    Singapore, Singapore

    2 h-index

    7 publications

    450 citations

  8. Los Alamos National Laboratory

    Los Alamos, United States

    2 h-index

    4 publications

    50 citations

1–8 of 157

Venues

  1. Reliability Engineering & System Safety

    4 publications · 233 citations

    4

    h-index

  2. PubMed

    Repository · 4 publications · 185 citations

    4

    h-index

  3. IEEE Transactions on Reliability

    4 publications · 199 citations

    4

    h-index

  4. IEEE Transactions on Automatic Control

    2 publications · 1.4K citations

    2

    h-index

  5. Technometrics

    2 publications · 25 citations

    2

    h-index

1–5