Examination Delay

Examination Delay is a patent term adjustment mechanism that compensates for administrative delays caused by the patent office during the prosecution process, specifically when the United States Patent and Trademark Office fails to issue a patent within three years of the application filing date.

13

Publications

943

Citations

30

Authors

25

Institutions

Publications per year

2017–2026

2

Variants

Patent Term Adjustment

Authors

30

  1. MF
    Michael Frakes

    Duke University, United States

    3 publications · 289 citations

    3

    h-index

  2. MF
    Melissa F. Wasserman

    The University of Texas at Austin, United States

    3 publications · 289 citations

    3

    h-index

  3. DP
    David Popp

    Syracuse University, United States

    1 publications · 128 citations

    1

    h-index

  4. KK
    Kristen Kastan

    Texas Children's Hospital, United States

    1 publications · 14 citations

    1

    h-index

  5. IK
    Indranil Kushare

    Children's Hospital of Philadelphia, United States

    1 publications · 14 citations

    1

    h-index

1–5 of 30

Venues

  1. Research Policy

    1 publications · 71 citations

    1

    h-index

  2. Management Science

    1 publications · 295 citations

    1

    h-index

  3. World Journal of Orthopedics

    WJO · 1 publications · 14 citations

    1

    h-index

  4. Journal of Memory and Language

    1 publications · 27 citations

    1

    h-index

  5. 1

    h-index

1–5