Environmental Reliability

Environmental Reliability is a reliability attribute within MEMS packaging that characterizes the ability of a microelectromechanical system to maintain specified performance under defined environmental stresses such as temperature, humidity, vibration, and contamination over its operational lifetime.

38

Publications

1.6K

Citations

118

Authors

40

Institutions

Publications per year

2017–2026

13

Authors

118

  1. AL
    Alex Lidow

    Stanford University, United States

    3 publications · 46 citations

    3

    h-index

  2. RS
    Rob Strittmatter

    3 publications · 46 citations

    3

    h-index

  3. TT
    Toyokazu Tabata

    Murata (Japan), Japan

    2 publications · 47 citations

    2

    h-index

  4. YM
    Yanping Ma

    Chinese Academy of Sciences, China

    2 publications · 36 citations

    2

    h-index

  5. HH
    Hiroyuki Hayashi

    Kyoto University, Japan

    2 publications · 47 citations

    2

    h-index

1–5 of 118

Venues

  1. Japanese Journal of Applied Physics

    JJAP · 2 publications · 47 citations

    2

    h-index

  2. AIP conference proceedings

    1 publications · 26 citations

    1

    h-index

  3. Journal of Experimental Child Psychology

    JECP · 1 publications · 31 citations

    1

    h-index

  4. 1

    h-index

  5. Journal of Ecology

    1 publications · 163 citations

    1

    h-index

1–5