Device Reputation

Device Reputation is a risk assessment metric within risk-based authentication that characterizes the trustworthiness of a specific device based on its historical behavioral patterns, known threat associations, and deviation from established norms to distinguish legitimate from potentially compromised access attempts.

52

Publications

2K

Citations

184

Authors

98

Institutions

Publications per year

2017–2026

29

Authors

184

  1. HL
    Hui Lin

    Fujian Normal University, China

    3 publications · 69 citations

    3

    h-index

  2. SS
    Salil S. Kanhere

    UNSW Sydney, Australia

    3 publications · 286 citations

    3

    h-index

  3. BK
    Burak Kantarcı

    University of Ottawa, Canada

    3 publications · 108 citations

    3

    h-index

  4. LX
    Li Xu

    Fujian Normal University, China

    3 publications · 69 citations

    3

    h-index

  5. GM
    Giuseppe M. L. Sarnè

    University of Reggio Calabria, Italy

    2 publications · 75 citations

    2

    h-index

1–5 of 184

Venues

  1. IEEE Access

    4 publications · 141 citations

    4

    h-index

  2. IEEE Internet of Things Journal

    2 publications · 67 citations

    2

    h-index

  3. Ad Hoc Networks

    2 publications · 99 citations

    2

    h-index

  4. Journal of Network and Computer Applications

    JNCA · 2 publications · 250 citations

    2

    h-index

  5. Sensors

    2 publications · 33 citations

    2

    h-index

1–5