Detector Biasing

Detector Biasing is a methodological technique in semiconductor detector systems that involves the application of a controlled external voltage to establish and maintain a depletion region within the semiconductor material, thereby enabling efficient charge carrier collection and optimal detector performance.

143

Publications

6.5K

Citations

905

Authors

251

Institutions

Publications per year

2017–2026

14

Authors

905

  1. RO
    Ryoichi Ohno

    The University of Tokyo, Japan

    6 publications · 415 citations

    6

    h-index

  2. RB
    R. B. James

    Brookhaven National Laboratory, United States

    4 publications · 185 citations

    4

    h-index

  3. AA
    A. A. Grillo

    University of California, Santa Cruz, United States

    4 publications · 157 citations

    4

    h-index

  4. SW
    Shin Watanabe

    The University of Tokyo, Japan

    4 publications · 319 citations

    4

    h-index

  5. TT
    Tadayuki Takahashi

    Institute of Space and Astronautical Science, Japan

    4 publications · 319 citations

    4

    h-index

1–5 of 905

Venues

  1. IEEE Transactions on Nuclear Science

    22 publications · 799 citations

    16

    h-index

  2. 15

    h-index

  3. Journal of Physics D Applied Physics

    6 publications · 132 citations

    6

    h-index

  4. 6

    h-index

  5. Journal of Instrumentation

    JINST · 4 publications · 116 citations

    4

    h-index

1–5