Detector Biasing
Detector Biasing is a methodological technique in semiconductor detector systems that involves the application of a controlled external voltage to establish and maintain a depletion region within the semiconductor material, thereby enabling efficient charge carrier collection and optimal detector performance.
143
Publications
6.5K
Citations
905
Authors
251
Institutions
Publications per year
2017–2026
14
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143
Nuclear Instruments and Methods in Physics Research A
S. Pesente, S. Vanini, M. Benettoni et al. · 2009 · 266 citations
Engineering, Electrical Engineering, Nuclear Engineering +15
Nuclear Instruments and Methods in Physics Research A
L. Castillo García · 2012 · 257 citations
Engineering, Electrical Engineering, Nuclear Engineering +15
Low-mass dark matter search with CDMSlite
R. Agnese, A. J. Anderson, T. Aralis et al. · Physical review. D/Physical review. D. · 2018 · 228 citations · Full text
Natural Sciences, Astronomy, Physics +16
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251
Politecnico di Milano
Milan, Italy
6 h-index
16 publications
255 citations

Lawrence Berkeley National Laboratory
Berkeley, United States
5 h-index
19 publications
784 citations
University of California, Berkeley
Berkeley, United States
4 h-index
25 publications
1.9K citations
Institute of Space and Astronautical Science
Tokyo, Japan
4 h-index
23 publications
2K citations
The University of Tokyo
Tokyo, Japan
4 h-index
24 publications
2.1K citations
Stanford University
Stanford, United States
4 h-index
38 publications
1.6K citations

Brookhaven National Laboratory
Upton, United States
4 h-index
7 publications
342 citations
Massachusetts Institute of Technology
Cambridge, United States
4 h-index
9 publications
544 citations
1–8 of 251
22 publications · 799 citations
16
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21 publications · 720 citations
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6 publications · 132 citations
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6 publications · 142 citations
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JINST · 4 publications · 116 citations
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