Debug Probe Techniques is a methodological framework within embedded debugging that characterizes the systematic approaches for instrumenting, accessing, and controlling a target embedded system's internal states through specialized hardware or software interfaces to enable real-time observation and analysis of program execution.
10
Publications
343
Citations
17
Authors
8
Institutions
Publications per year
2017–2026
0
Parents
Publications
10
The good, the bad, and the ugly of silicon debug
D. Josephson · 2006 · 66 citations
Engineering, Computer Engineering, Electrical Engineering +15
The manic depression of microprocessor debug
D. Josephson · 2003 · 61 citations
A Multi-Core Debug Platform for NoC-Based Systems
2007 · 45 citations
A Multi-Core Debug Platform for NoC-Based Systems
Marek Olszewski, Keir Mierle, Adam Czajkowski et al. · 2007 · 31 citations
1–5 of 10
Authors
17
- QX
2
h-index
- ST
2
h-index
- DJ
2
h-index
- KD
1
h-index
- AC
1
h-index
1–5 of 17
Institutions
8
Intel (United States)
Santa Clara, United States
3 h-index
5 publications
174 citations
Chinese University of Hong Kong
Hong Kong, Hong Kong
2 h-index
3 publications
63 citations
University of Toronto
Toronto, Canada
1 h-index
4 publications
124 citations
Intel (United Kingdom)
Swindon, United Kingdom
1 h-index
1 publications
24 citations
Hewlett-Packard (United States)
Palo Alto, United States
1 h-index
1 publications
61 citations
Polytechnique Montréal
Montreal, Canada
1 h-index
2 publications
36 citations
Korea Advanced Institute of Science and Technology
Daejeon, South Korea
1 h-index
4 publications
76 citations
Beijing University of Posts and Telecommunications
Beijing, China
1 h-index
2 publications
70 citations
1–8 of 8
Venues
- Proceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits
Conference · 1 publications · 19 citations
1
h-index
1–1