Dead Layer Characterization

Dead Layer Characterization is a methodological framework in nuclear radiation detection that identifies and quantifies the non-sensitive surface region of a semiconductor detector, which attenuates incident alpha particle energy without contributing to the electrical signal generation.

80

Publications

2.4K

Citations

398

Authors

157

Institutions

Publications per year

2017–2026

14

Authors

398

  1. PS
    P. Siffert

    Centre National de la Recherche Scientifique, France

    2 publications · 41 citations

    2

    h-index

  2. ZW
    Zhouguang Wang

    Wenzhou Medical University, China

    2 publications · 31 citations

    2

    h-index

  3. KS
    Katsuhiro Sasaki

    Nagoya University, Japan

    2 publications · 31 citations

    2

    h-index

  4. MH
    M. Hult

    European Commission, Belgium

    2 publications · 87 citations

    2

    h-index

  5. CN
    C. N. Inskeep

    Oak Ridge National Laboratory, United States

    2 publications · 51 citations

    2

    h-index

1–5 of 398

Venues

  1. Applied Physics Letters

    10 publications · 328 citations

    10

    h-index

  2. 7

    h-index

  3. IEEE Transactions on Nuclear Science

    6 publications · 167 citations

    6

    h-index

  4. Journal of Applied Physics

    5 publications · 155 citations

    5

    h-index

  5. IEEE Transactions on Magnetics

    4 publications · 67 citations

    4

    h-index

1–5