Dead Layer Characterization
Dead Layer Characterization is a methodological framework in nuclear radiation detection that identifies and quantifies the non-sensitive surface region of a semiconductor detector, which attenuates incident alpha particle energy without contributing to the electrical signal generation.
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2.4K
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398
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157
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2017–2026
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Shanshan Xu, Kuan‐Hung Chen, Neil P. Dasgupta et al. · Journal of The Electrochemical Society · 2019 · 86 citations · Full text
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Argonne National Laboratory
Lemont, United States
5 h-index
14 publications
346 citations

Centre National de la Recherche Scientifique
Paris, France
4 h-index
15 publications
277 citations

Oak Ridge National Laboratory
Oak Ridge, United States
3 h-index
10 publications
312 citations
Tsinghua University
Beijing, China
2 h-index
14 publications
300 citations
Advanced Engineering Services (Japan)
Tokyo, Japan
2 h-index
2 publications
31 citations
Nagoya University
Nagoya, Japan
2 h-index
4 publications
62 citations
National Institute of Standards and Technology
Gaithersburg, United States
2 h-index
4 publications
182 citations
University of California, Berkeley
Berkeley, United States
2 h-index
10 publications
276 citations
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10 publications · 328 citations
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7 publications · 194 citations
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5 publications · 155 citations
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