Conductivity Temperature Depth Profilers

Conductivity Temperature Depth Profiler is an oceanographic instrument system that measures the fundamental physical properties of seawater—specifically electrical conductivity, temperature, and pressure—as a function of depth to determine salinity and density profiles in the marine environment.

101

Publications

4.7K

Citations

463

Authors

202

Institutions

Publications per year

2017–2026

34

Variants

CtdCtd Profilers

Authors

463

  1. FR
    Fabien Roquet

    Laboratoire d'Océanographie et du Climat : Expérimentations et Approches Numériques, France

    3 publications · 61 citations

    3

    h-index

  2. SR
    Søren Rysgaard

    Aarhus University, Denmark

    3 publications · 43 citations

    3

    h-index

  3. LC
    Lijing Cheng

    Institute of Atmospheric Physics, China

    3 publications · 184 citations

    3

    h-index

  4. DS
    David Smeed

    National Oceanography Centre, United Kingdom

    2 publications · 179 citations

    2

    h-index

  5. GG
    G. Griffiths

    National Oceanography Centre, United Kingdom

    2 publications · 179 citations

    2

    h-index

1–5 of 463

Venues

  1. Journal of Atmospheric and Oceanic Technology

    17 publications · 847 citations

    16

    h-index

  2. Journal of Geophysical Research Atmospheres

    JGR · 12 publications · 650 citations

    12

    h-index

  3. Ocean science

    6 publications · 195 citations

    6

    h-index

  4. Journal of Physical Oceanography

    4 publications · 173 citations

    4

    h-index

  5. Journal of Geophysical Research Oceans

    4 publications · 181 citations

    4

    h-index

1–5