Conductivity Temperature Depth Profilers
Conductivity Temperature Depth Profiler is an oceanographic instrument system that measures the fundamental physical properties of seawater—specifically electrical conductivity, temperature, and pressure—as a function of depth to determine salinity and density profiles in the marine environment.
101
Publications
4.7K
Citations
463
Authors
202
Institutions
Publications per year
2017–2026
34
Variants
CtdCtd Profilers
Parents
101
1–5 of 101
463
Laboratoire d'Océanographie et du Climat : Expérimentations et Approches Numériques, France
3 publications · 61 citations
3
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3
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3
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2
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2
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1–5 of 463
202

Chinese Academy of Sciences
Beijing, China
7 h-index
21 publications
896 citations

National Oceanography Centre
Southampton, United Kingdom
6 h-index
18 publications
1.1K citations
Woods Hole Oceanographic Institution
Falmouth, United States
5 h-index
7 publications
338 citations
Japan Agency for Marine-Earth Science and Technology
Yokosuka, Japan
5 h-index
7 publications
728 citations
Institute of Oceanology
Qingdao, China
4 h-index
14 publications
640 citations

Centre National de la Recherche Scientifique
Paris, France
4 h-index
5 publications
144 citations
NOAA Pacific Marine Environmental Laboratory
Seattle, United States
4 h-index
9 publications
533 citations

Scripps Institution of Oceanography
La Jolla, United States
4 h-index
12 publications
774 citations
1–8 of 202
17 publications · 847 citations
16
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JGR · 12 publications · 650 citations
12
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6 publications · 195 citations
6
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4 publications · 173 citations
4
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4 publications · 181 citations
4
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1–5