Concepedia

Charging Compensation

Charging Compensation is a methodological technique in X-ray Photoelectron Spectroscopy used to mitigate surface potential shifts in non-conductive samples by applying a flood of low-energy electrons or ions, thereby stabilizing the measured binding energies.

36

Publications

1.8K

Citations

132

Authors

61

Institutions

Publications per year

2017–2026

8

Variants

Charge Compensation

Parents

Publications

36

XPS guide: Charge neutralization and binding energy referencing for insulating samples

Donald R. Baer, Kateryna Artyushkova, Hagai Cohen et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2020 · 274 citations · Full text

, , +17

Studies in differential charging

Tery L. Barr · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 126 citations

, , +17

About the charge compensation of insulating samples in XPS

J. Cazaux · Journal of Electron Spectroscopy and Related Phenomena · 2000 · 122 citations

, , +8

Performance and application of the scienta ESCA300 spectrometer

G. Beamson, D. Briggs, S. F. Davies et al. · Surface and Interface Analysis · 1990 · 112 citations

, , +17

Use of an Electron Flood Gun to Reduce Surface Charging in X-Ray Photoelectron Spectroscopy

D. A. Huchital, R. T. McKeon · Applied Physics Letters · 1972 · 79 citations

, , +13

1–5 of 36

Authors

132

  1. DR
    Donald R. Baer

    Pacific Northwest National Laboratory, United States

    2 publications · 349 citations

    2

    h-index

  2. DM
    David Morgan

    Cardiff University, United Kingdom

    2 publications · 328 citations

    2

    h-index

  3. ME
    Mark Engelhard

    Pacific Northwest National Laboratory, United States

    2 publications · 349 citations

    2

    h-index

  4. PM
    Paul Mack

    University of Southampton, United Kingdom

    2 publications · 328 citations

    2

    h-index

  5. DJ
    Daniel J. Gaspar

    Pacific Northwest National Laboratory, United States

    1 publications · 75 citations

    1

    h-index

1–5 of 132

Institutions

61

  1. Centre National de la Recherche Scientifique

    Paris, France

    2 h-index

    3 publications

    184 citations

  2. Beijing University of Technology

    Beijing, China

    2 h-index

    14 publications

    168 citations

  3. Pacific Northwest National Laboratory

    Richland, United States

    2 h-index

    15 publications

    3.1K citations

  4. Cardiff University

    Cardiff, United Kingdom

    2 h-index

    12 publications

    2.8K citations

  5. Thermo Fisher Scientific (United Kingdom)

    London, United Kingdom

    2 h-index

    11 publications

    2.8K citations

  6. Paderborn University

    Paderborn, Germany

    1 h-index

    3 publications

    75 citations

  7. University of Wisconsin–Milwaukee

    Milwaukee, United States

    1 h-index

    1 publications

    126 citations

  8. Beihang University

    Beijing, China

    1 h-index

    2 publications

    82 citations

1–8 of 61

Venues

  1. Surface and Interface Analysis

    SIA · 7 publications · 393 citations

    7

    h-index

  2. 3

    h-index

  3. 3

    h-index

  4. Ultramicroscopy

    3 publications · 53 citations

    3

    h-index

  5. Journal of Applied Physics

    3 publications · 108 citations

    3

    h-index

1–5