Absolute Yield Mapping

Absolute Yield Mapping is a yield mapping methodology that belongs to the class of quantitative agricultural assessment techniques, specifically distinguished by its reliance on raw, unnormalized crop yield data to generate spatial representations of productivity across a field without adjustment for external variables or relative scaling.

3

Publications

70

Citations

33

Authors

29

Institutions

Publications per year

2017–2026

1

Authors

33

  1. AW
    Andrzej Wróbel

    Jagiellonian University, Poland

    1 publications · 10 citations

    1

    h-index

  2. RS
    Rastislav Skalský

    International Institute for Applied Systems Analysis, Austria

    1 publications · 48 citations

    1

    h-index

  3. AC
    Alex C. Ruane

    Goddard Institute for Space Studies, United States

    1 publications · 48 citations

    1

    h-index

  4. VM
    V. M. Romanova

    P.N. Lebedev Physical Institute of the Russian Academy of Sciences, Russia

    1 publications · 12 citations

    1

    h-index

  5. WL
    Wenfeng Liu

    Swiss Federal Institute of Aquatic Science and Technology, Switzerland

    1 publications · 48 citations

    1

    h-index

1–5 of 33

Venues

  1. IEEE Transactions on Plasma Science

    1 publications · 12 citations

    1

    h-index

  2. International Journal of PIXE

    IJPIXE · 1 publications · 10 citations

    1

    h-index

  3. Precision Agriculture

    1 publications · 10 citations

1–3