Adam Łaszcz

AŁ

Statistics

Publications

Citations

226

H-Index

Active since

2007

Affiliations

Institute of Electron Technology(Current)

Centre National de la Recherche Scientifique

Polish Academy of Sciences

Institut d'électronique de microélectronique et de nanotechnologie

Institute of Physical Chemistry

Adam Łaszcz is an author at Institute of Electron Technology specializing in materials science, materials engineering, and semiconductor device materials.

ORCID

Publications per year

2007–2019

Publications

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Paweł Borowicz, Mariusz Latek, W. Rzodkiewicz et al. · Advances in Natural Sciences Nanoscience and Nanotechnology · 2012 · 99 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap

Nicolas Reckinger, Xiaohui Tang, Vincent Bayot et al. · Journal of Applied Physics · 2008 · 22 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Terahertz Time-Domain Spectroscopy of Graphene Nanoflakes Embedded in Polymer Matrix

Anton Koroliov, Genyu Chen, Kenneth M. Goodfellow et al. · Applied Sciences · 2019 · 22 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

Paweł Borowicz, Mariusz Latek, W. Rzodkiewicz et al. · Advances in Natural Sciences Nanoscience and Nanotechnology · 2012 · 21 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Schottky barrier lowering with the formation of crystalline Er silicide on n-Si upon thermal annealing

Nicolas Reckinger, Xiaohui Tang, Vincent Bayot et al. · Applied Physics Letters · 2009 · 20 citations · Full text

Engineering, Materials Engineering, Materials Science +17

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