J. H. Yeh is an author at KLA (United States) specializing in design for testing, defect tolerance, and computer engineering.
Top concepts
DesignData MiningEngineeringData ScienceSoftware DesignDefect ToleranceMicroelectronicsSoftware TestingDesign For TestingComputer Engineering
Publications per year
2007–2013
2
2
High-performance inductors for integrated fan-out wafer level packaging (InFO-WLP)
S. M. Chen, Lei Huang, J. H. Yeh et al. · 2013 · 10 citations
Rows per page
1–2 of 2