Bart Johnson

High Resolution 3D X-Ray Diffraction Microscopy

Jianwei Miao, Tetsuya Ishikawa, Bart Johnson et al. · Physical Review Letters · 2002 · 325 citations

Engineering, Microscopy, Nm Resolution +18

A seven-crystal Johann-type hard x-ray spectrometer at the Stanford Synchrotron Radiation Lightsource

Dimosthenis Sokaras, T.-C. Weng, Dennis Nordlund et al. · Review of Scientific Instruments · 2013 · 164 citations · Full text

Electric field screening by photogenerated holes in multiple quantum wells: A new mechanism for absorption saturation

Thomas H. Wood, J. Pastalan, C.A. Burrus et al. · Applied Physics Letters · 1990 · 127 citations

Engineering, Cavity Qed, Optical Properties +16

Quantitative Image Reconstruction of GaN Quantum Dots from Oversampled Diffraction Intensities Alone

Jianwei Miao, Yoshinori Nishino, Yoshiki Kohmura et al. · Physical Review Letters · 2005 · 110 citations · Full text

Engineering, Microscopy, Electron Diffraction +26

A high resolution and large solid angle x-ray Raman spectroscopy end-station at the Stanford Synchrotron Radiation Lightsource

Dimosthenis Sokaras, Dennis Nordlund, T.-C. Weng et al. · Review of Scientific Instruments · 2012 · 94 citations · Full text

High Resolution, X-ray Spectroscopy, Engineering +17