W. McBride

Residual stress, microstructure, and structure of tungsten thin films deposited by magnetron sputtering

Y.G. Shen, Q. C. Zhang, David R. McKenzie et al. · Journal of Applied Physics · 2000 · 212 citations

Thin Film Physics, Engineering, Tungsten Thin Films +16

Exit wave reconstruction at atomic resolution

L. J. Allen, W. McBride, N. L. O'Leary et al. · Ultramicroscopy · 2004 · 161 citations

Quantum Science, Engineering, Quantum Computing +8

Composition, residual stress, and structural properties of thin tungsten nitride films deposited by reactive magnetron sputtering

Y.G. Shen, David R. McKenzie, Q. C. Zhang et al. · Journal of Applied Physics · 2000 · 109 citations

Materials Engineering, Materials Science, Structural Properties +15

Retrieval of a Complex-Valued Object from its Diffraction Pattern

W. McBride, N. L. O'Leary, Leslie J. Allen · Physical Review Letters · 2004 · 57 citations

Engineering, Image Analysis, Optical Properties +18

Structural properties and nitrogen-loss characteristics in sputtered tungsten nitride films

Y.G. Shen, Yiu‐Wing Mai, W. McBride et al. · Thin Solid Films · 2000 · 54 citations

Materials Science, Materials Engineering, Boron Nitride +7